Advanced Electric Microscope for Metallographic Analysis and Inspection

Product Details
Customization: Available
Magnification: 50-100X
Type: Metallographic
Manufacturer/Factory, Trading Company

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  • Advanced Electric Microscope for Metallographic Analysis and Inspection
  • Advanced Electric Microscope for Metallographic Analysis and Inspection
  • Advanced Electric Microscope for Metallographic Analysis and Inspection
  • Advanced Electric Microscope for Metallographic Analysis and Inspection
  • Advanced Electric Microscope for Metallographic Analysis and Inspection
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  • Overview
  • Product Description
  • Detailed Photos
  • Company Profile
Overview

Basic Info.

Model NO.
FC-DTN-2001DS
Number of Cylinder
Binoculars
Mobility
Desktop
Stereoscopic Effect
Stereoscopic Effect
Shape
Rectangular Prism
Usage
Teaching, Research
Principle
Optics
Principle of Optics
Differential Interference Contrast Microscope
Measurement Size
200×100×200
Glass Stage
260×160
Working Table
366×266
Weight
75
Tube
Trinocular Tube with TV Camera
Nosepiece
Manual Quintuple
Linear Scale
Xyz 0.0005mm or 0.0001mm
Accuracy
X-Y≤(2.5+0.02L)Um Z≤(4+0.02L)Um L:mm
Transport Package
Wood Cart
Specification
580× 750× 720
Origin
China
HS Code
9011200000

Product Description

Advanced Electric Microscope for Metallographic Analysis and Inspection
 
Intro
Precision cast aluminum base column, three-layer ductile iron nickel plated precision platform
Z-axis electric coarse and fine adjustment design, separate control box and control box design, reducing faults and facilitating maintenance
Z-axis precise focusing through electric pulse (minimum displacement can be fine to 0.0001mm)
Optional Z-axis manual coarse and fine adjustment mechanism (minimum displacement can be finely adjusted to 0.0001~0.0005mm)
Product Description

Technical parameters
 

Model FC-DTN-2001DS FC-DTN-3002DS
Measurement Size 200×100×200 300×200×200
Glass Stage 260×160 360×260
Working table 366×266 466×366
Dimensions 580×750×720 680×750×720
Weight 75 120
Tube Trinocular tube with TV Camera
ObservationMode Standard for BF observation/Optional for BF&DF and DIC,Polorized /Support FA
Eyepieces 10X
Objectives Plan semiapochromat Metallurgical Objectives for BF 5x,10x,20x,50x 100x(Optional)
Nosepiece Manual Quintuple
Reflected Light Adjustable aperture diaphragm and field diaphragm;Slot for filter and polarizer
Transmitted Light LED White light/Optional for other color
Focus DS:Z-axis motorized contro /S:Z-axis manual control
Linear Scale XYZ 0.0005mm or 0.0001mm
Accuracy X-Y≤(2.5+0.02L)um Z≤(4+0.02L)um L:mm
 
Detailed Photos
Advanced Electric Microscope for Metallographic Analysis and Inspection
Advanced Electric Microscope for Metallographic Analysis and Inspection

 

Company Profile

Welcome to Guangdong FORTH Science Technology Co., Ltd.

Specializing in the sales and maintenance of a variety of instruments, including length measuring, optical, shape, material testing, and chemical analyzers for food and medicine.

Established in 2005, our headquarters is located in Guangzhou, a city known for economic development and excellent transportation infrastructure.

We work with globally renowned instrument brands like FISCHER, ZEISS, BRUKER, MITUTOYO, SHIMADZU, KEYENCE, FOSS, and STRUERS, ensuring high-precision instruments and exceptional user experience.

Our product range includes projectors, altimeters, surface roughness measurement instruments, color difference meters, hardness testers, spectrometers, and chromatographs.

Committed to customer satisfaction, we prioritize quality, cutting-edge products, and innovative solutions for superior quality, advanced technology, and exceptional service.

Join us at Guangdong FORTH Science Technology Co., Ltd. for a premium experience!

Advanced Electric Microscope for Metallographic Analysis and Inspection

Advanced Electric Microscope for Metallographic Analysis and Inspection
Advanced Electric Microscope for Metallographic Analysis and InspectionAdvanced Electric Microscope for Metallographic Analysis and InspectionAdvanced Electric Microscope for Metallographic Analysis and Inspection

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